The Electron Microprobe lab offers non-destructive chemical analyses of solids using a JEOL JXA-8200 Electron Probe Microanalyzer (EPMA) with an EDX detector. The microprobe is capable of quantitatively measuring the abundance of all elements from C to U using five wavelength-dispersive spectrometers (WDS) and an energy-dispersive X-Ray spectrometer (EDX) for rapid analyses. This analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of …

The Electron Microprobe Lab houses a JEOL JXA-8500F electron microprobe that is equipped with a field-emission cathode, five wavelength-dispersive X-Ray spectrometers, and an energy-dispersive spectrometer. Electron microprobe analysis (EMPA) is mainly used to quantitatively investigate the chemical composition of rocks and mineral phases in the micrometer to centimeter range.
Typically, polished sections of rocks or minerals are used for this purpose, but highly vacuum-resistant fossil …

The Institute of Geological Sciences hosts a JEOL JXA 8200 Superprobe equipped with five wavelength-dispersive spectrometers (WDS) and one energy-dispersive (EDS) detector. We perform non-destructive chemical analysis and imaging of solid materials at the micrometer scale using a focused electron beam. The instrument is primarily used in WDS mode for quantitative analysis against reference materials and element distribution mapping. Other applications are: qualitative element analysis (EDS, …

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two …

The Scanning Electron Microscopy Lab houses a JEOL JSM-6610LV scanning electron microscope (SEM). The SEM is equipped with a LaB₆ cathode and is coupled to a Bruker Quantax 800 energy-dispersive X-Ray spectrometer, a cathodoluminescence detector, and an electron-backscatter diffraction detector. The SEM is typically used for structural and chemical analysis of rocks, minerals, and fossils. The large sample chamber holds objects up to ten centimeters in size. The SEM can be operated in a …

The "Automated Mineralogy Lab" is equipped with a field emission SEM and light microscope for thin section mapping. The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with a Zeiss Gemini column, two Bruker Quantax Xflash 60 mm² SSD EDS detectors for quantitative element analysis, one variable pressure secondary electron detector (VPSE), one high definition backscatter detector (HDBSE), one Inlens detector, two Zeiss ATLAS correlative microscopy systems, two …

The ZELMI lab for transmission electron microscopy (S)TEM provides high-resolution images of electron-transparent samples, analyses of topography and microstructure, crystal and crystal defect analyses via EDX as well as sub-atomic resolution in HR-(S)TEM.
For high-resolution transmission electron microscopy analyses, two devices are available. The JEOL JEM-ARM300F2 "GrandARM2"is one of the most versatile and highest-resolution STEMs. The first instrument of this type outside Japan was …

The electron beam microprobe - EPMA is applied for qualitative and quantitative elemental analysis with highest spatial resolution and detection sensitivity. The electron beam microprobe is a Jeol JXA-8530F equipped with a Schottky field emission cathode primarily used for quantitative elemental analyses of high accuracy and resolution.
With the JEOL JXA-8530F, both SE and BSE recordings are possible in COMPO and TOPO modes. It is equipped with 5 WDX spectrometers for wavelength dispersive …

Focused Ion Beam Analysis are applied for high-resolution SEM images of cross-sectional surfaces and their prior target preparation, high-resolution scanning ion images (SIM) with topography and channeling contrast, and furthermore target preparation of electron transparent (S)TEM samples and lithographic processing of samples. The Focused Ion Beam (FIB) is the so-called Nano-Workbench, a dual-beam FIB/SEM instrument (Thermofisher HELIOS 600) combining a high-resolution electron microscope …

The SEM laboratory provides high-resolution images with topography and element contrast, elemental analysis with EDX, crystal analysis with EBSD and in situ analysis, e.g. tensile-pressure module.
The SEM laboratory covers conventional scanning electron microscopy (SEM), high-resolution scanning electron microscopy (HR-SEM) and low vacuum scanning electron microscopy (VP SEM) analyses.
For conventional SEM measurements the follwing devices are available: a Hitachi S-2700 scanning …