ZELMI - (Scanning) Transmission Electron Microscope - (S)TEM

TU - Technische Universität Berlin
last updated: July 19, 2023

About the Laboratory

ZELMI - (Scanning) Transmission Electron Microscope - (S)TEM

TU - Technische Universität Berlin
@ Institute of Optics and Atomic Physics
This Laboratory is part of:


  • Tbd
Visit us on our website in DE / EN


The ZELMI lab for transmission electron microscopy (S)TEM provides high-resolution images of electron-transparent samples, analyses of topography and microstructure, crystal and crystal defect analyses via EDX as well as sub-atomic resolution in HR-(S)TEM.
For high-resolution transmission electron microscopy analyses, two devices are available. The JEOL JEM-ARM300F2 "GrandARM2"is one of the most versatile and highest-resolution STEMs. The first instrument of this type outside Japan was installed at our facility in 2020-21. Its spectrum ranges from sub-atomic (!) resolution imaging, to atomic resolution elemental mappings, to nano beam diffraction and so-called 4D STEM analyses with the EDX detectors and a Direct Electron (Pixelated) detector.
The FEI TITAN80-300 Berlin Holography Special TEM is a TEM specialized in electron holography and ultrahigh resolution, equipped for this purpose with a Cs corrector on the image side and a world-first X lens. It was installed in 2011.
For conventional TEM a Tecnai G2 20S-Twin is used which received an upgrade to (S)TEM in 2018. Thanks to the EDX system, it is ideally suited as an analytical screening instrument, which is also capable of high-resolution investigations. Due to the versatile holder fleet, the instrument is ideally suited for various types of examination methods.


  • HR-TEM - High-Resolution Transmission Electron Microscope

Analytical Methods

  • HR-TEM - High-Resolution Transmission Electron Microscopy

  • EDS, EDX, EDXA, EDXS, Energy Dispersive X-Ray Microanalysis, Energy Dispersive X-Ray Spectroscopy, Energy-dispersive X-Ray Analysis, Energy-dispersive X-Ray Spectroscopy, XEDS

Laboratory Keywords

  • Elemental Analysis via Diffraction Patterns
  • Qualitative Energy Dispersive X-Ray Analysis
  • STEM
  • Scanning Transmission Electron Microscope
  • Scanning Transmission Electron Microscopy