ZELMI - Scanning Electron Microscope -SEM

The SEM laboratory provides high-resolution images with topography and element contrast, elemental analysis with EDX, crystal analysis with EBSD and in situ analysis, e.g. tensile-pressure module.
The SEM laboratory covers conventional scanning electron microscopy (SEM), high-resolution scanning electron microscopy (HR-SEM) and low vacuum scanning electron microscopy (VP SEM) analyses.
For conventional SEM measurements the follwing devices are available: a Hitachi S-2700 scanning electron microscope with a tungsten cathode, optimised for large samples and analytical questions, and a Hitachi S-520 scanning electron microscope with tungsten cathode, optimised for the self-reliant use by trainees and for hands-on training.
The high-resolution SEM measurements are performed with a low vacuum high-resolution SEM ZEISS Gemini SEM500 NanoVP, a Hitachi SU8030 SEM with a cold field emission cathode, a Zeiss DSM 982 GEMINI SEM with thermal field emission cathode optimised for high-resolution and X-Ray analysis at low accelerating voltage and a Hitachi S-4000 SEM with cold field emitter optimised for highest resolution.