Scanning Electron Microscopy Lab (SEM)

FU - Freie Universität Berlin

last updated: September 21, 2023

About the Laboratory

Scanning Electron Microscopy Lab (SEM)

FU - Freie Universität Berlin

@ Mineralogy

This Laboratory is part of:

Mineralogy Laboratories laboratory complex
Networks: Geo.X

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Description

The "Automated Mineralogy Lab" is equipped with a field emission SEM and light microscope for thin section mapping. The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with a Zeiss Gemini column, two Bruker Quantax Xflash 60 mm² SSD EDS detectors for quantitative element analysis, one variable pressure secondary electron detector (VPSE), one high definition backscatter detector (HDBSE), one Inlens detector, two Zeiss ATLAS correlative microscopy systems, two mineralogic mining automated mineralogy systems, and two reservoir mining automated pore analysis systems. The SEM is applied for high-resolution automated surface imaging (Zeiss ATLAS), surface morphology imaging of uncoated, unpolished samples (Low Vac, environmental SEM), automated quantitative mineralogy and porosity mapping of thin sections, fast automated search of specific mineral phases (i.e. sulfides, zirkons), grain size/shape analysis and mineral paragenesis analysis, and cathodoluminescence analysis (with VPSE Detector).
The ZEISS Axio Imager M2m is optimized for automated transmitted/reflected light thin section mapping. It is equipped with four objectives 2.5x, 5x, 10x, and 20x (optimized for reflected light), polarized transmitted light / motorized reflectors for polarized reflected light, a motorized stage, a high definition digital camera, Zen Blue Software, and a high performance PC for the analysis of GB-sized image data. The microscope is applied for fast full thin sections mapping for the correlation with SEM images and EDS data and fast thin section search for opaque phases like sulfides, oxides, etc.

Instruments

MICROSCOPES are instruments that magnify the image of small objects. (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
Microscope
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland] (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
SEM - Scanning Electron Microscope

Analytical Methods

Reflected Light Microscopy
Transmitted Light Microscopy
CL - Cathodoluminescence Microscopy
Cathodoluminescence
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland]
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-Rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland] (Source: NASA; UUID: 04e586f0-569b-467d-b9ca-b43bc6802f4b) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
SEM - Scanning Electron Microscopy
The Energy Dispersive Analysis of X-ray (EDAX) is a tool that determines the chemical composition of elements.
The Energy Dispersive Analysis of X-Ray (EDAX) is a tool that determines the chemical composition of elements. (Source: NASA; UUID: b3a7155c-5089-4388-a148-8d4defc520f8); Measurement method of X-Ray fluorescence analysis in which the energies and intensities of characteristic X-radiation are used to measure amounts of elements. (Source: IUPAC; https://doi.org/10.1515/pac-2019-0302) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
EDAX - Energy Dispersive Analysis of X-Ray
EDS, EDX, EDXA, EDXS, Energy Dispersive X-Ray Microanalysis, Energy Dispersive X-Ray Spectroscopy, Energy-dispersive X-Ray Analysis, Energy-dispersive X-Ray Spectroscopy, XEDS

Laboratory Keywords

In addition to the instruments and analytical methods listed above, these keywords help to describe the work done in the laboratory. This may include the type of samples, standard materials, specific preparative or analytical methods and specific instrument characteristics.

Thin Sections

Disciplines

Geoscience > Geochemistry > Mineralogy
Mineralogy

The Research Network for Geosciences in Berlin and Potsdam

Scanning Electron Microscopy Lab (SEM)

FU - Freie Universität Berlin

About the Laboratory

Scanning Electron Microscopy Lab (SEM)

Access

Description

Instruments

Analytical Methods

Laboratory Keywords

Disciplines

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