Scanning Electron Microscope (SEM)

UP - University of Potsdam

last updated: July 19, 2023

About the Laboratory

Scanning Electron Microscope (SEM)

UP - University of Potsdam

@ Mineralogy

This Laboratory is part of:

Mineralogy Equipment laboratory complex
Networks: Geo.X

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Description

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two sample coaters are available: C-coater (POLARON CC7650 Carbon Coater and Au/Pd-coater (POLARON SC7620 Mini Sputter Coater).

Instruments

The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland] (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
SEM - Scanning Electron Microscope

Analytical Methods

EBSD - Electron Backscatter Diffraction
CL - Cathodoluminescence Microscopy
Cathodoluminescence
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland]
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-Rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland] (Source: NASA; UUID: 04e586f0-569b-467d-b9ca-b43bc6802f4b) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
SEM - Scanning Electron Microscopy
The Energy Dispersive Analysis of X-ray (EDAX) is a tool that determines the chemical composition of elements.
The Energy Dispersive Analysis of X-Ray (EDAX) is a tool that determines the chemical composition of elements. (Source: NASA; UUID: b3a7155c-5089-4388-a148-8d4defc520f8); Measurement method of X-Ray fluorescence analysis in which the energies and intensities of characteristic X-radiation are used to measure amounts of elements. (Source: IUPAC; https://doi.org/10.1515/pac-2019-0302) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
EDAX - Energy Dispersive Analysis of X-Ray
EDS, EDX, EDXA, EDXS, Energy Dispersive X-Ray Microanalysis, Energy Dispersive X-Ray Spectroscopy, Energy-dispersive X-Ray Analysis, Energy-dispersive X-Ray Spectroscopy, XEDS

Laboratory Keywords

In addition to the instruments and analytical methods listed above, these keywords help to describe the work done in the laboratory. This may include the type of samples, standard materials, specific preparative or analytical methods and specific instrument characteristics.

Rare Earth Elements

Disciplines

Geoscience > Geochemistry > Geochemistry
Geochemistry
Geoscience > Geochemistry > Mineralogy
Mineralogy
Geoscience > Geology > Geology
Geology

The Research Network for Geosciences in Berlin and Potsdam

Scanning Electron Microscope (SEM)

UP - University of Potsdam

About the Laboratory

Scanning Electron Microscope (SEM)

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Description

Instruments

Analytical Methods

Laboratory Keywords

Disciplines

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