The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allows you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the Inlens & SE-Detector for high-resolution images, the inlens Energy selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for impressive material contrast of any samples, and …

The scanning electron microscope provides microphotographs with up to five thousand times magnification. The generated images are images of the object surfaces and have a high depth of focus. Objects from micropaleontology such as foraminifera, ostracods and gastropods are routinely analyzed with the aid of this instrument. For this purpose a ZEISS SUPRATM 40 VP Ultra with a thermal field emission cathode (with variably adjustable pressure for detailed topographic imaging of non-conductive …

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two …

The Scanning Electron Microscopy Lab houses a JEOL JSM-6610LV scanning electron microscope (SEM). The SEM is equipped with a LaB₆ cathode and is coupled to a Bruker Quantax 800 energy-dispersive X-Ray spectrometer, a cathodoluminescence detector, and an electron-backscatter diffraction detector. The SEM is typically used for structural and chemical analysis of rocks, minerals, and fossils. The large sample chamber holds objects up to ten centimeters in size. The SEM can be operated in a …

The "Automated Mineralogy Lab" is equipped with a field emission SEM and light microscope for thin section mapping. The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with a Zeiss Gemini column, two Bruker Quantax Xflash 60 mm² SSD EDS detectors for quantitative element analysis, one variable pressure secondary electron detector (VPSE), one high definition backscatter detector (HDBSE), one Inlens detector, two Zeiss ATLAS correlative microscopy systems, two …

The SEM laboratory provides high-resolution images with topography and element contrast, elemental analysis with EDX, crystal analysis with EBSD and in situ analysis, e.g. tensile-pressure module.
The SEM laboratory covers conventional scanning electron microscopy (SEM), high-resolution scanning electron microscopy (HR-SEM) and low vacuum scanning electron microscopy (VP SEM) analyses.
For conventional SEM measurements the follwing devices are available: a Hitachi S-2700 scanning …