PISA – ZEISS Ultra Plus Scanning Electron Microscope (SEM)

GFZ - German Research Centre for Geosciences
last updated: July 19, 2023

About the Laboratory

PISA – ZEISS Ultra Plus Scanning Electron Microscope (SEM)

GFZ - German Research Centre for Geosciences
@ Section 3.5 Interface Geochemistry
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Description

The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allows you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the Inlens & SE-Detector for high-resolution images, the inlens Energy selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for impressive material contrast of any samples, and Energy Dispersive Spectroscopy (EDS) for elemental analysis.
We can use Ultra Plus in diverse scientific fields, including Materials and Geological Research: combined analytical procedures and retrieve of maximum amount of information from your sample and in Life Sciences to analyze samples easily with high throughput and get large volumes of data. Further, Ultra Plus also provides the option for analyzing biological specimen in natural state using Cryo attachment and Cathodoluminescence (CL) for mineralogical analysis.

Instruments

Analytical Methods

  • EBSD - Electron Backscatter Diffraction
  • CL - Cathodoluminescence Microscopy
    Cathodoluminescence

  • EDS, EDX, EDXA, EDXS, Energy Dispersive X-Ray Microanalysis, Energy Dispersive X-Ray Spectroscopy, Energy-dispersive X-Ray Analysis, Energy-dispersive X-Ray Spectroscopy, XEDS

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