Cathodoluminescence microscopy is a technique to visualize in minerals and materials heterogeneities and internal structures that are invisible using pure optical methods (reflected and transmitted light microscopy). Internal structures of minerals become visible and are indicative of growth zoning, trace element zoning and structures allowing processes such as mineral growth, resolution and alteration to be reconstructed. Furthermore, it helps to rapidly distinguish optical similar minerals, …

The Electron Microprobe lab offers non-destructive chemical analyses of solids using a JEOL JXA-8200 Electron Probe Microanalyzer (EPMA) with an EDX detector. The microprobe is capable of quantitatively measuring the abundance of all elements from C to U using five wavelength-dispersive spectrometers (WDS) and an energy-dispersive X-Ray spectrometer (EDX) for rapid analyses. This analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of …

The laboratory for microscopy focuses on the specific requirements of microfacies analysis of lake sediments, but also offers a wide range of possibilities for other applications. Sedimentological, petrographic and microfacies analyses on all kinds of covered and uncovered thin sections and polished sections with transmitted and incident light are performed.

The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allows you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the Inlens & SE-Detector for high-resolution images, the inlens Energy selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for impressive material contrast of any samples, and …

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two …

The Scanning Electron Microscopy Lab houses a JEOL JSM-6610LV scanning electron microscope (SEM). The SEM is equipped with a LaB₆ cathode and is coupled to a Bruker Quantax 800 energy-dispersive X-Ray spectrometer, a cathodoluminescence detector, and an electron-backscatter diffraction detector. The SEM is typically used for structural and chemical analysis of rocks, minerals, and fossils. The large sample chamber holds objects up to ten centimeters in size. The SEM can be operated in a …

The Scanning Electron Microscopy Lab additionally houses a Lumic HC3-LM "hot-cathode" cathodoluminescence (CL) microscope that is coupled to an optical microscope fitted with a color CCD camera. Color CL signals can be obtained from thin-sectioned rock and mineral samples, and CL signals, recorded with the CCD camera, allow, e.g., identification and spatial mapping of zoning patterns in minerals such as zircon and calcite.

The "Automated Mineralogy Lab" is equipped with a field emission SEM and light microscope for thin section mapping. The Zeiss Sigma 300 VP Field-Emission Scanning Electron Microscope is equipped with a Zeiss Gemini column, two Bruker Quantax Xflash 60 mm² SSD EDS detectors for quantitative element analysis, one variable pressure secondary electron detector (VPSE), one high definition backscatter detector (HDBSE), one Inlens detector, two Zeiss ATLAS correlative microscopy systems, two …