The Electron Microprobe lab offers non-destructive chemical analyses of solids using a JEOL JXA-8200 Electron Probe Microanalyzer (EPMA) with an EDX detector. The microprobe is capable of quantitatively measuring the abundance of all elements from C to U using five wavelength-dispersive spectrometers (WDS) and an energy-dispersive X-Ray spectrometer (EDX) for rapid analyses. This analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of …

The Electron Microprobe Lab houses a JEOL JXA-8500F electron microprobe that is equipped with a field-emission cathode, five wavelength-dispersive X-Ray spectrometers, and an energy-dispersive spectrometer. Electron microprobe analysis (EMPA) is mainly used to quantitatively investigate the chemical composition of rocks and mineral phases in the micrometer to centimeter range.
Typically, polished sections of rocks or minerals are used for this purpose, but highly vacuum-resistant fossil …

The Institute of Geological Sciences hosts a JEOL JXA 8200 Superprobe equipped with five wavelength-dispersive spectrometers (WDS) and one energy-dispersive (EDS) detector. We perform non-destructive chemical analysis and imaging of solid materials at the micrometer scale using a focused electron beam. The instrument is primarily used in WDS mode for quantitative analysis against reference materials and element distribution mapping. Other applications are: qualitative element analysis (EDS, …

The electron microprobe technique allows for nondestructive analyses of smallest parts of materials (in micrometer range) with high precision. Materials that can be analyzed are embedded and polished mineral grains (also gemstones), glass particles as well as rocks. Except for H, He, and Li all elements of the periodic table until including U can be detected and quantified. The GFZ maintains two electron microprobes, a JEOL Hyperprobe JXA-8530F PLUS with a field emission (FE) electron gun and …

The electron beam microprobe - EPMA is applied for qualitative and quantitative elemental analysis with highest spatial resolution and detection sensitivity. The electron beam microprobe is a Jeol JXA-8530F equipped with a Schottky field emission cathode primarily used for quantitative elemental analyses of high accuracy and resolution.
With the JEOL JXA-8530F, both SE and BSE recordings are possible in COMPO and TOPO modes. It is equipped with 5 WDX spectrometers for wavelength dispersive …