Sample Analysis Laboratory

DLR - German Aerospace Center

last updated: January 12, 2026

About the Laboratory

Sample Analysis Laboratory

DLR - German Aerospace Center

@ Institute of Planetary Research / Planetary Laboratories

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Description

The Sample Analysis Laboratory (SAL) provides a comprehensive range of instrumentation for structural, geochemical, mineralogical and elemental analysis at one location in a clean room environment allowing efficient analysis with a minimal disturbance to sensitive material. The research focus is on extraterrestrial material in the form of meteorites and returned samples, as well as analogue material for planetary research.

Instruments

The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland] (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
SEM - Scanning Electron Microscope
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is capable of high spatial resolution and relatively high analytical sensitivity. [Source: Caltech] (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
EMP - Electron Microprobe
EPMA, Electron Micro Probe Analyzer, Electron Probe Microanalyzer, X-Ray-Microanalyzer
FTIR SPECTROMETER - Fourier Transform Infrared Spectrometer Traditional (dispersive) infrared techniques experience difficulties due to the '1 wavenumber at a time' nature of data acquisition. This leads to either a poor signal to noise ratio in a spectrum or a very long time needed to obtain a high quality spectrum. Both these situations cause problems with kinetic work. The first gives inherent large errors, the second prohibits in-situ work. These problems can be overcome using Fourier transform infrared spectroscopy (FT-IR) that is based on the interferometer originally designed by Michelson and a mathematical procedure developed by Fourier that converts response from the 'time' to the 'frequency' domain. In the Michelson interferometer a parallel, polychromatic beam of radiation from a source (A) is directed to a beam splitter (B), made from an infrared transparent material, such as KBr. The beam splitter reflects approximately half of the light to a mirror, known as the fixed mirror (C), which in turn reflects the light back to the beam splitter. The rest of the light passes through to a mirror, moving continuously, at a known velocity, back and forth along the direction of the incoming light and this is known as the moving mirror (D). Upon reflection from the moving mirror, radiation is then directed back to the beam splitter. At the beam splitter some of the light that has been reflected from the fixed mirror combines with light reflected from the moving mirror and is directed towards the sample. After passing through the sample (E) the radiation is focused onto the detector (F). The detectors are sufficiently fast to cope with time domain signal changes from the modulatio n in the interferometer. Additional information available at http://physics.nist.gov/Divisions/Div842/Gp1/fts_intro.html (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
FTIR Spectrometer - Fourier Transform Infrared Spectrometer
A XRD - X-Ray Diffractometer is an instrument that uses a crystal to diffract x-rays for the measurement of the intensities of the diffracted rays. [Summary provided by The Photonics Dictionary] (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
XRD - X-Ray Diffractometer

Analytical Methods

The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland]
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. By scanning an electron probe across a specimen, high resolution images of the morphology or topography of a specimen, with great depth of field, at very low or very high magnifications can be obtained. Compositional analysis of a material may also be obtained by monitoring secondary X-Rays produced by the electron-specimen interaction. Thus detailed maps of elemental distribution can be produced from multi-phase materials or complex, bio-active materials. Characterization of fine particulate matter in terms of size, shape, and distribution as well as statistical analyses of these parameters, may be performed. There are many different types of SEM designed for specific purposes ranging from routine morphological studies, to high-speed compositional analyses or to the study of environment-sensitive materials. The Centre for Microscopy & Microanalysis presents three particular types of SEM that, in combination, provide a powerful analytical approach for many research or quality-control applications. Additional information available at "http://www.uq.edu.au/nanoworld/sem_gen.html" [Summary provided by The University of Queensland] (Source: NASA; UUID: 04e586f0-569b-467d-b9ca-b43bc6802f4b) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
SEM - Scanning Electron Microscopy
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is capable of high spatial resolution and relatively high analytical sensitivity. [Source: Caltech]
This is a general term for methods using bombardment of a solid specimen by electrons which generate a variety of signals providing the basis for a number of different analytical techniques. (Source: IUPAC; https://media.iupac.org/publications/analytical_compendium/) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
EMPA - Electron Microprobe Analysis
EPMA, Electron Probe Microanalysis
FTIR SPECTROMETER - Fourier Transform Infrared Spectrometer Traditional (dispersive) infrared techniques experience difficulties due to the '1 wavenumber at a time' nature of data acquisition. This leads to either a poor signal to noise ratio in a spectrum or a very long time needed to obtain a high quality spectrum. Both these situations cause problems with kinetic work. The first gives inherent large errors, the second prohibits in-situ work. These problems can be overcome using Fourier transform infrared spectroscopy (FT-IR) that is based on the interferometer originally designed by Michelson and a mathematical procedure developed by Fourier that converts response from the 'time' to the 'frequency' domain. In the Michelson interferometer a parallel, polychromatic beam of radiation from a source (A) is directed to a beam splitter (B), made from an infrared transparent material, such as KBr. The beam splitter reflects approximately half of the light to a mirror, known as the fixed mirror (C), which in turn reflects the light back to the beam splitter. The rest of the light passes through to a mirror, moving continuously, at a known velocity, back and forth along the direction of the incoming light and this is known as the moving mirror (D). Upon reflection from the moving mirror, radiation is then directed back to the beam splitter. At the beam splitter some of the light that has been reflected from the fixed mirror combines with light reflected from the moving mirror and is directed towards the sample. After passing through the sample (E) the radiation is focused onto the detector (F). The detectors are sufficiently fast to cope with time domain signal changes from the modulatio n in the interferometer. Additional information available at http://physics.nist.gov/Divisions/Div842/Gp1/fts_intro.html
Infrared spectroscopy in which a Fourier-transform spectrometer is used to separate the transmitted radiation into its component wavenumbers. (Source: IUPAC; https://iupac.org/wp-content/uploads/2019/10/PAC-REC-19-02-03.R2_PR191002MC.pdf (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
FTIR Spectroscopy - Fourier Transform Infrared Spectroscopy
A XRD - X-Ray Diffractometer is an instrument that uses a crystal to diffract x-rays for the measurement of the intensities of the diffracted rays. [Summary provided by The Photonics Dictionary]
Measurement method using diffraction of X-radiation to obtain the spatial arrangement of atoms in a crystalline sample. Note 1: Bragg reflection follows nl = 2 d sin q, where l is the X-Ray wavelength, d is the spacing between atomic planes, and q is the angle of diffraction. Note 2: Copper K-a radiation (l = 0.15406 nm, E = 8.04 keV) is typically used for routine XRD. (Source: IUPAC; https://doi.org/10.1515/pac-2019-0302) (Source: Global Change Master Directory (GCMD). 2023. GCMD Keywords, Version 16.3 [...] )
XRD - X-Ray Diffraction
X-Ray Diffraction Analysis

Laboratory Keywords

In addition to the instruments and analytical methods listed above, these keywords help to describe the work done in the laboratory. This may include the type of samples, standard materials, specific preparative or analytical methods and specific instrument characteristics.

Disciplines

Geoscience > Geochemistry > Mineralogy
Mineralogy
Geoscience > Geochemistry > Petrology
Petrology
Geoscience > Space Physics and Planetary Science > Planetary Sciences
Planetary Sciences

The Research Network for Geosciences in Berlin and Potsdam

Sample Analysis Laboratory

DLR - German Aerospace Center

About the Laboratory

Sample Analysis Laboratory

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Description

Instruments

Analytical Methods

Laboratory Keywords

Disciplines

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