Microprobe Lab

The electron microprobe technique allows for nondestructive analyses of smallest parts of materials (in micrometer range) with high precision. Materials that can be analyzed are embedded and polished mineral grains (also gemstones), glass particles as well as rocks. Except for H, He, and Li all elements of the periodic table until including U can be detected and quantified. The detection limits are usually between 5 and 800 µg/g, depending on the comparability of the concentration of the element sought from the standard and sample, the intensity of the selected X-ray line, and thus also on the excitation voltage and the beam current as well as the counting time. Element distribution maps are recorded over a certain area of the sample or in a certain mineral either by scanning the electron beam over the sample or by moving the sample under the electron beam. The GFZ maintains two electron microprobes, a JEOL Hyperprobe JXA-8530F PLUS with a field emission (FE) electron gun and a JEOL Superprobe JXA 8230 with a tungsten or LaB₆ cathode. The facility is available for GFZ employees as well as for external users / research groups. For sample preparation and user regulations please see here.