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- Belt Sander
- BIB - Broad Ion Beam Polisher
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- Coater
- CSLM - Confocal Lase…Scanning Microscope
- FIB - Focused Ion Beam
- FIB-SEM - Focused Io…Electron Microscope
- Grinding Machine
- HTTP-IRMS - High-Tem…o Mass Spectrometer
- Increment Borer
- IRMS - Isotope Ratio Mass Spectrometer
- Laser Microdissection Microscope
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GFZ Helmholtz Centre for GeosciencesThe Laboratory for Dendroclimatology aims to reconstruct the temporal and spatial variability of the climate of the past utilizing multi-parameter tree ring analysis and to assess and verify the causes of climate change and its impact on woody plants.
The following tasks are covered:
- quantitative analysis of the climate-signal transfer from atmosphere through soil and leaf into the wood of tree rings (Monitoring, calibration and verification of tree ring parameters vs. instrumental …
GFZ Helmholtz Centre for GeosciencesSample preparation instruments are available for all kinds of samples for scanning electron microscopes and transmission electron microscopes: Gold-Palladium Sputter Coater - Leica; Carbon Coater - Leica; Cryo Sample Preparation - Leica; Gatan Model 656 Dimple Grinder - a precision tool used to mechanically produce dimples in the surface of materials like ceramics, semiconductors and metals; Gatan Model Duo Mill 600 - a post-ion milling device used to prepare electron transparent specimens for …
TU - Technische Universität BerlinSamples that are to be examined with the aid of a microscope must be prepared specifically for the instrument. To do this, the conditions of the instrument and the sample holder must be known: sample size - sample height or thickness - surface condition - conductivity - vacuum resistance. For any examination procedure, the sample should first be viewed with a light microscope.
There are preparation facilities for the use of the available equipment. This option is primarily intended for users …