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- Coating
- Cryo Ultramicrotomy
- Cryo-Vitrification
- CSLM - Confocal Lase…Scanning Microscopy
- FIB-SEM - Focused Io…Electron Microscopy
- Glow Discharge
- Grinding
- HTP-IRMS - High-Temp…o Mass Spectrometry
- IRMS - Isotope Ratio Mass Spectrometry
- LMD - Laser Microdissection
- Microscopy
- Microtomy
- Polishing
- Resin Embedding
- Sputtering
- Tree Ring Analysis
- Ultramicrotomy
- Belt Sander
- BIB - Broad Ion Beam Polisher
- Binocular
- Coater
- CPD - Critical Point Dryer
- CSLM - Confocal Lase…Scanning Microscope
- FIB - Focused Ion Beam
- FIB-SEM - Focused Io…Electron Microscope
- Grinding Machine
- HTTP-IRMS - High-Tem…o Mass Spectrometer
- Increment Borer
- IRMS - Isotope Ratio Mass Spectrometer
- Laser Microdissection Microscope
- Microscope
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- Vitrification Apparatus
GFZ Helmholtz Centre for GeosciencesThe Dendroclimatology Laboratory serves for the reconstruction of temporal and spatial variability of the climate of the past utilizing multi-parameter tree ring analysis.
Aims:
- to reconstruct the temporal and spatial variability of the climate of the past utilizing multi-parameter tree ring analysis
- to assess and verify the causes of climate change and its impact on woody plants
Tasks:
- quantitative analysis of the climate-signal transfer from atmosphere through soil …
GFZ Helmholtz Centre for GeosciencesSample preparation instruments are available for all kinds of samples for scanning electron microscopes and transmission electron microscopes: Gold-Palladium Sputter Coater - Leica; Carbon Coater - Leica; Cryo Sample Preparation - Leica; EM CPD300 Critical Point Dryer - Leica; Gatan Model 656 Dimple Grinder - a precision tool used to mechanically produce dimples in the surface of materials like ceramics, semiconductors and metals; Gatan Model Duo Mill 600 - a post-ion milling device used to …
TU - Technische Universität BerlinSamples that are to be examined with the aid of a microscope must be prepared specifically for the instrument. To do this, the conditions of the instrument and the sample holder must be known: sample size - sample height or thickness - surface condition - conductivity - vacuum resistance. For any examination procedure, the sample should first be viewed with a light microscope.
There are preparation facilities for the use of the available equipment. This option is primarily intended for …