ZELMI - Preparation
TU - Technische Universität Berlin
last updated: July 19, 2023
About the Laboratory
ZELMI - Preparation
TU - Technische Universität Berlin
@ Institute of Optics and Atomic Physics
This Laboratory
is part of:
- ZELMI - Electron Microscopy Center laboratory complex
- Networks: Geo.X
Access
- Tbd
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Description
Samples that are to be examined with the aid of a microscope must be prepared specifically for the instrument. To do this, the conditions of the instrument and the sample holder must be known: sample size - sample height or thickness - surface condition - conductivity - vacuum resistance. For any examination procedure, the sample should first be viewed with a light microscope.
There are preparation facilities for the use of the available equipment. This option is primarily intended for users who do not have their own preparation laboratories and, like the instrument hours, is considered a service.
- Metallographic preparation for light microscopy, scanning electron microscopy and the electron beam microprobe
- Preparation for transmission electron microscopy
- Cross Section Polisher
- Target Preparation with FIB
- Coating
- Plasma-Cleaning
Instruments
-
FIB-SEM - Focused Ion Beam Scanning Electron Microscope
Dual Beam Instrument -
Microtome
Sliding Microtome - Saw
- Polishing Machine
- Coater
- Sputter
-
BIB - Broad Ion Beam Polisher
Cross Section Polisher -
FIB - Focused Ion Beam
Focused Ion Beam System
Analytical Methods
- FIB-SEM - Focused Ion Beam Scanning Electron Microscopy
- Microtomy
- Grinding
- Polishing
- Sputtering
- Coating
Laboratory Keywords
In addition to the instruments and analytical methods listed above, these keywords help to describe the work done in the laboratory. This may include the type of samples, standard materials, specific preparative or analytical methods and specific instrument characteristics.