The laboratory for microscopy focuses on the specific requirements of microfacies analysis of lake sediments, but also offers a wide range of possibilities for other applications. Sedimentological, petrographic and microfacies analyses on all kinds of covered and uncovered thin sections and polished sections with transmitted and incident light are performed.

In our laboratory, the stable isotopes of the light elements carbon (C), nitrogen (N), oxygen (O) and hydrogen (H) in continental geoarchives such as lake sediments and speleothems as well as in precipitation and surface water are measured. Stable isotopes are non-radioactive nuclides of an element with the same number of protons and different numbers of neutrons and thus different atomic masses. This results in different physical properties that can lead to a shift in the isotope ratios in a …

The laboratory for XRF Element Scanning provides qualitative and non-destructive analyses of sediment compositions based on X-Ray Fluorescence. These analyses provide detailed element records and maps that can be used to characterize past depositional, environmental and climatic conditions.
In detail, the lab is equipped with an X-Ray fluorescence core scanner to analyze split core sections up to 180 cm length and diameters between 6 and 12 cm. Further, two micro X-Ray fluorescence scanner …

In the Organic Surface Geochemistry Lab (OSGLab) of the Geomorphology section, the smallest of molecules and isotopes open a door to the past. In the OSGLab we conduct research on regional differences of the causes and effects of past climate change and variations in biochemical cycles. In some projects, we can determine the "traces" of climate change down to a decade, in other projects biogeochemical processes are traced over millions of years.
In the laboratory, changes in the carbon …

The new state-of-the-art transmission electron microscope from Thermo Fisher Scientific Themis Z brings a lot of new opportunities for the characterization of crystal structure, microstructures and chemical composition of materials. Simultaneous imaging of heavy and light elements, and atomic resolution elemental imaging allow to investigate atomic structure with sub-Angstrom resolution.

The FEI Quanta 3D FEG is a state-of-the-art Dual Beam machine combining traditional thermal emission scanning electron microscope (SEM) with focused ion beam (FIB). This combination allows the characterization of materials in 2D and 3D (tomography), TEM sample preparation (TEM Lamella), observations at the subsurface of the specimens (cross section imaging) and structural modification of sample surfaces at the micrometer to nanometer scale.
The machine features three different vacuum modes …

One key feature of the FIB is the fast and easy TEM sample preparation. The FEI Helios G4 UC Dual Beam is part of the fourth generation of the leading Helios Dual Beam family. It combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Tomahawk ion column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion …

Liquid Phase-(Scanning) Transmission Electron Microscopy (LP-(S)TEM) allows in situ observations of the dynamic behaviour of materials in liquids, with both high spatial resolution and temporal resolution. In LP-(S)TEM, the liquid cell is mounted at the tip of a specific TEM sample holder, wherein the sample and solvent are placed in-between two electron-transparent windows. Optimal spatial resolution is obtained by minimizing the liquid thickness surrounding the sample, which is achievable …

Sample preparation instruments are available for all kinds of samples for scanning electron microscopes: Gold-Palladium Sputter Coater - Leica; Carbon Coater - Leica; Cryo Sample Preparation - Leica; Gatan Model 656 Dimple Grinder - a precision tool used to mechanically produce dimples in the surface of materials like ceramics, semiconductors and metals; Gatan Model Duo Mill 600 - a post-ion milling device used to prepare electron transparent specimens for transmission electron microscopy; …

The Transmission Electron Microscopy TEM laboratory is a state-of-the-art facility equipped with a FEI Tecnai G2 F20 X-Twin transmission electron microscope and a FEI FIB200TEM Focused Ion Beam device for specimen preparation. The laboratory provides powerful techniques for characterization of crystal structure, microstructures and chemical composition of materials down to a near atomic level.