One key feature of the FIB is the fast and easy TEM sample preparation. The FEI Helios G4 UC Dual Beam is part of the fourth generation of the leading Helios Dual Beam family. It combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Tomahawk ion column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion …

Focused Ion Beam Analysis are applied for high-resolution SEM images of cross-sectional surfaces and their prior target preparation, high-resolution scanning ion images (SIM) with topography and channeling contrast, and furthermore target preparation of electron transparent (S)TEM samples and lithographic processing of samples. The Focused Ion Beam (FIB) is the so-called Nano-Workbench, a dual-beam FIB/SEM instrument (Thermofisher HELIOS 600) combining a high-resolution electron microscope …

Samples that are to be examined with the aid of a microscope must be prepared specifically for the instrument. To do this, the conditions of the instrument and the sample holder must be known: sample size - sample height or thickness - surface condition - conductivity - vacuum resistance. For any examination procedure, the sample should first be viewed with a light microscope.
There are preparation facilities for the use of the available equipment. This option is primarily intended for users …