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13 laboratories found (0.059 s)
  • TU - Technische Universität Berlin

    Acid digestions of solid samples for main and trace element analysis are carried out in a modern digestion laboratory with special digestors that are also suitable for working with hydrofluoric and perchloric acid. The samples can be prepared as open digestions using the DigiPrep heating block system (SCP Science) or as closed digestions using the Multiwave 5000 microwave reaction platform (Anton Paar).
    The Vitriox Electric 4+ fusion unit from Fluxana is available for the production of glass …

  • TU - Technische Universität Berlin

    Jaw crushers are available for crushing rocks and other geological samples. Various mills (vibrating disc mill, McCrone mill) are available for further processing, which pulverize the granulates for further analysis.

  • TU - Technische Universität Berlin

    LA-ICP-MS is a micro-destructive technique which enables the in situ analysis of elements and isotope ratios across the periodic table at very high scanning speeds and with very low detection limits. The 8900 ICP-QQQ is able to utilize reactive cell gases to resolve difficult spectral interferences. Samples: rock sections (max. 10 x 10 cm), 1 and 1/2 inch rounds; Spot size: 1 - 155 μm

  • TU - Technische Universität Berlin

    The Rigaku SmartLab is a multipurpose X-Ray diffractometer system equipped with a high-flux 9kW rotating Cu anode and a 2D-detector. The X-Y-Z table holds samples up to 20 kg in weight and allows mappings on samples with a dimension of up to 87 x 100 mm. The device can be used for powder diffraction and for µ-spot analysis on different types of rock sections. Samples: Rock powders, sections up to 20 kg and 87 x 100 mm; Spot size: 100 μm / 300 μm / 500 μm

  • TU - Technische Universität Berlin

    Bruker M4 Tornado is an energy-dispersive micro-X-Ray fluorescence spectrometer for the spatially resolved analysis of elements with atomic numbers from 11 (sodium). The device can analyze a wide range of samples such as large, inhomogeneous samples such or small particles. The M4 is equipped with capillary optics that realize spot sizes of 20 or 150 μm. Samples: rock sections or crystals, max. 190 x 160 mm; Spot size: 20 μm / 150 μm

  • TU - Technische Universität Berlin

    A special grinding laboratory enables the production of thin sections of various rock types. Precision saws in various sizes, a grinding machine (MPS), a lapping machine (Logitec) and a polishing machine are available for this.

  • TU - Technische Universität Berlin

    The wavelength dispersive X-Ray fluorescence spectrometer S8 Tiger 4 KW (Bruker) enables the detection of major and trace elements in one run. The chemical composition of rocks, minerals, ore and soil samples, and building materials can be measured in the form of powder tablets and glass beads at the lower ppm-level. Our element spectrum ranges from elements with mass 9 (F) to 92 (U).

  • TU - Technische Universität Berlin

    The ZELMI lab for transmission electron microscopy (S)TEM provides high-resolution images of electron-transparent samples, analyses of topography and microstructure, crystal and crystal defect analyses via EDX as well as sub-atomic resolution in HR-(S)TEM.
    For high-resolution transmission electron microscopy analyses, two devices are available. The JEOL JEM-ARM300F2 "GrandARM2"is one of the most versatile and highest-resolution STEMs. The first instrument of this type outside Japan was …

  • TU - Technische Universität Berlin

    The electron beam microprobe - EPMA is applied for qualitative and quantitative elemental analysis with highest spatial resolution and detection sensitivity. The electron beam microprobe is a Jeol JXA-8530F equipped with a Schottky field emission cathode primarily used for quantitative elemental analyses of high accuracy and resolution.
    With the JEOL JXA-8530F, both SE and BSE recordings are possible in COMPO and TOPO modes. It is equipped with 5 WDX spectrometers for wavelength dispersive …

  • TU - Technische Universität Berlin

    Focused Ion Beam Analysis are applied for high-resolution SEM images of cross-sectional surfaces and their prior target preparation, high-resolution scanning ion images (SIM) with topography and channeling contrast, and furthermore target preparation of electron transparent (S)TEM samples and lithographic processing of samples. The Focused Ion Beam (FIB) is the so-called Nano-Workbench, a dual-beam FIB/SEM instrument (Thermofisher HELIOS 600) combining a high-resolution electron microscope …