ZELMI - Atomic Force Microscopy

TU - Technische Universität Berlin
last updated: October 13, 2025

About the Laboratory

ZELMI - Atomic Force Microscopy

TU - Technische Universität Berlin
@ Institute of Optics and Atomic Physics
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Description

The atomic force field microscopy is a scanning probe imaging technique allowing 3D-analysis of sample topography with atomic level resolution. The scanning area comprises 100 µm x 100 µm x 100 µm, maximum height 25 µm; the maximum sample size is 80 mm x 80 mm x 20 mm.

Instruments

  • AFM - Atomic Force Microscope
    Scanning Force Microscope

Analytical Methods

  • AFM - Atomic Force Microscopy
    Atomic Force Imaging, Scanning Force Microscopy

Laboratory Keywords

    Disciplines

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