The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allows you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the Inlens & SE-Detector for high-resolution images, the inlens Energy selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for impressive material contrast of any samples, and …

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two …