The laboratory for thin-section preparation is specialized in the preparation of thin sections of soft and unconsolidated lacustrine and marine sediments, soils, hygroscopic sediment samples such as salts and clays, and freeze cores, as well as of hard rock, minerals, ores, and grain samples.

Thick and thin sections, ultrathin sections, polished sections (single and double-sided), grain mounts (minerals embedded in epoxy), single crystal slides and reference samples of various formats can …

Mineralogical preparation covers the spectrum of coarse and fine sawing work, polished sections and thin sections polished on one or both sides. Surface and thin sections can be produced in Giessen format or as one-inch cylindrical sections. The laboratory is equipped with various rock saws, an inner diameter saw, two GNM grinding machines, two Logitech polishing machines, and a polishing machine for vibration polishing.

Sample preparation instruments are available for all kinds of samples for scanning electron microscopes and transmission electron microscopes: Gold-Palladium Sputter Coater - Leica; Carbon Coater - Leica; Cryo Sample Preparation - Leica; Gatan Model 656 Dimple Grinder - a precision tool used to mechanically produce dimples in the surface of materials like ceramics, semiconductors and metals; Gatan Model Duo Mill 600 - a post-ion milling device used to prepare electron transparent specimens for …

The preparation lab offers different preparation methods such as thin-section production, polishes, dye methods, hardening methods and others.

In the Rock-Lab thin-section, thick-section, polished-section and separation work can be used for teaching and research. The thin-section preparation is an important method for working on paleontological, geological and mineralogical questions.

A special grinding laboratory enables the production of thin sections of various rock types. Precision saws in various sizes, a grinding machine (MPS), a lapping machine (Logitec) and a polishing machine are available for this.

Samples that are to be examined with the aid of a microscope must be prepared specifically for the instrument. To do this, the conditions of the instrument and the sample holder must be known: sample size - sample height or thickness - surface condition - conductivity - vacuum resistance. For any examination procedure, the sample should first be viewed with a light microscope.
There are preparation facilities for the use of the available equipment. This option is primarily intended for users …