The Electron Microprobe lab offers non-destructive chemical analyses of solids using a JEOL JXA-8200 Electron Probe Microanalyzer (EPMA) with an EDX detector. The microprobe is capable of quantitatively measuring the abundance of all elements from C to U using five wavelength-dispersive spectrometers (WDS) and an energy-dispersive X-Ray spectrometer (EDX) for rapid analyses. This analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of …

The Institute of Geological Sciences hosts a JEOL JXA 8200 Superprobe equipped with five wavelength-dispersive spectrometers (WDS) and one energy-dispersive (EDS) detector. We perform non-destructive chemical analysis and imaging of solid materials at the micrometer scale using a focused electron beam. The instrument is primarily used in WDS mode for quantitative analysis against reference materials and element distribution mapping. Other applications are: qualitative element analysis (EDS, …

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two …

The Scanning Electron Microscopy Lab houses a JEOL JSM-6610LV scanning electron microscope (SEM). The SEM is equipped with a LaB₆ cathode and is coupled to a Bruker Quantax 800 energy-dispersive X-Ray spectrometer, a cathodoluminescence detector, and an electron-backscatter diffraction detector. The SEM is typically used for structural and chemical analysis of rocks, minerals, and fossils. The large sample chamber holds objects up to ten centimeters in size. The SEM can be operated in a …

The SEM laboratory provides high-resolution images with topography and element contrast, elemental analysis with EDX, crystal analysis with EBSD and in situ analysis, e.g. tensile-pressure module.
The SEM laboratory covers conventional scanning electron microscopy (SEM), high-resolution scanning electron microscopy (HR-SEM) and low vacuum scanning electron microscopy (VP SEM) analyses.
For conventional SEM measurements the follwing devices are available: a Hitachi S-2700 scanning …