The electron microprobe technique allows for nondestructive analyses of smallest parts of materials (in micrometer range) with high precision. Materials that can be analyzed are embedded and polished mineral grains (also gemstones), glass particles as well as rocks. Except for H, He, and Li all elements of the periodic table until including U can be detected and quantified. The GFZ maintains two electron microprobes, a JEOL Hyperprobe JXA-8530F PLUS with a field emission (FE) electron gun and …

The new state-of-the-art transmission electron microscope from Thermo Fisher Scientific Themis Z brings a lot of new opportunities for the characterization of crystal structure, microstructures and chemical composition of materials. Simultaneous imaging of heavy and light elements, and atomic resolution elemental imaging allow to investigate atomic structure with sub-Angstrom resolution.

The FEI Quanta 3D FEG is a state-of-the-art Dual Beam machine combining traditional thermal emission scanning electron microscope (SEM) with focused ion beam (FIB). This combination allows the characterization of materials in 2D and 3D (tomography), TEM sample preparation (TEM Lamella), observations at the subsurface of the specimens (cross section imaging) and structural modification of sample surfaces at the micrometer to nanometer scale.
The machine features three different vacuum modes …

The Transmission Electron Microscopy TEM laboratory is a state-of-the-art facility equipped with a FEI Tecnai G2 F20 X-Twin transmission electron microscope and a FEI FIB200TEM Focused Ion Beam device for specimen preparation. The laboratory provides powerful techniques for characterization of crystal structure, microstructures and chemical composition of materials down to a near atomic level.

The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allows you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high-tech Gemini FE-SEM column with various detectors: the Inlens & SE-Detector for high-resolution images, the inlens Energy selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for impressive material contrast of any samples, and …