GFZ - German Research Centre for Geosciences
Sample preparation instruments are available for all kinds of samples for scanning electron microscopes: Gold-Palladium Sputter Coater - Leica; Carbon Coater - Leica; Cryo Sample Preparation - Leica; Gatan Model 656 Dimple Grinder - a precision tool used to mechanically produce dimples in the surface of materials like ceramics, semiconductors and metals; Gatan Model Duo Mill 600 - a post-ion milling device used to prepare electron transparent specimens for transmission electron microscopy; …
TU - Technische Universität Berlin
Samples that are to be examined with the aid of a microscope must be prepared specifically for the instrument. To do this, the conditions of the instrument and the sample holder must be known: sample size - sample height or thickness - surface condition - conductivity - vacuum resistance. For any examination procedure, the sample should first be viewed with a light microscope.
There are preparation facilities for the use of the available equipment. This option is primarily intended for users …