The Electron Microprobe lab offers non-destructive chemical analyses of solids using a JEOL JXA-8200 Electron Probe Microanalyzer (EPMA) with an EDX detector. The microprobe is capable of quantitatively measuring the abundance of all elements from C to U using five wavelength-dispersive spectrometers (WDS) and an energy-dispersive X-Ray spectrometer (EDX) for rapid analyses. This analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of …

A scanning electron microscope (SEM) is designed for fast analytical and micro-morphological investigation of surfaces. The lab is running a JEOL JSM-6510 Scanning Electron Microscope (SEM) (W-filament, 0.5-30 kV acceleration voltage) combined with an Oxford Instrument INCAx-act detector (Energy Dispersive X-Ray spectrometer, EDX) for fast analytical and micro-morphological investigations. The maximum sample size is 32 mm in diameter; spatial resolution of the SEM down to 3 nm (30 kV). Two …