X-Ray Powder diffraction is a non-destructive technique for phase- and Rietveld analysis of crystalline materials. It is used for the determination of detailed phase composition, quantitative Rietveld analysis, nanocrystallite-sizes, lattice parameters, amorphous content, and 1d-Mappings. The lab is equipped with an Empyrean powder X-Ray diffractometer (Panalytical), working in reflection (Bragg-Brentano) or transmission theta-theta geometry. It is equipped with a Cu-tube, a fast PIXcel 1d …