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  • TU - Technische Universität Berlin

    The ZELMI lab for transmission electron microscopy (S)TEM provides high-resolution images of electron-transparent samples, analyses of topography and microstructure, crystal and crystal defect analyses via EDX as well as sub-atomic resolution in HR-(S)TEM.
    For high-resolution transmission electron microscopy analyses, two devices are available. The JEOL JEM-ARM300F2 "GrandARM2"is one of the most versatile and highest-resolution STEMs. The first instrument of this type outside Japan was …